A Fast Optimal Robust Path Delay Fault Testable
نویسندگان
چکیده
In this paper we explore the test complexity of the adder function with respect to the robust path delay fault model. A lower bound of (n 2) for the cardi-nality of a complete test set for a combinational n-bit adder is proven. This result is valid for any adder design known until now. In addition we present a fast O(p n)-time adder that is fully robust path delay fault testable with a test set of size (n 2).
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